654 search results - page 97 / 131 » Linearity Testing in Characteristic Two |
116
Voted
CVPR
2006
IEEE
16 years 5 months ago
2006
IEEE
In this paper we propose diffusion distance, a new dissimilarity measure between histogram-based descriptors. We define the difference between two histograms to be a temperature f...
135
click to vote
CVPR
2006
IEEE
16 years 5 months ago
2006
IEEE
We propose a novel method for tracking an articulated model in a 3D-point cloud. The tracking problem is formulated as the registration of two point sets, one of them parameterise...
122
Voted
CVPR
2007
IEEE
16 years 5 months ago
2007
IEEE
In this paper, we introduce the Skellam distribution as a sensor noise model for CCD or CMOS cameras. This is derived from the Poisson distribution of photons that determine the s...
154
Voted
DAC
2003
ACM
16 years 4 months ago
2003
ACM
Chemical-mechanical planarization (CMP) and other manufacturing steps in very deep-submicron VLSI have varying effects on device and interconnect features, depending on the local ...
115
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ACCV
2009
Springer
15 years 10 months ago
2009
Springer
Abstract. We propose an online learning algorithm to tackle the problem of learning under limited computational resources in a teacher-student scenario, over multiple visual cues. ...