72 search results - page 15 / 15 » Logic Programming Foundations of Cyber-Physical Systems |
ISCA
2008
IEEE
14 years 23 days ago
2008
IEEE
As CMOS technology scales and more transistors are packed on to the same chip, soft error reliability has become an increasingly important design issue for processors. Prior resea...
DFT
2006
IEEE
14 years 12 days ago
2006
IEEE
1 High temperature has become a major problem for system-on-chip testing. In order to reduce the test time while keeping the temperature of the chip under test within a safe range,...