During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide a sufficiently high fault coverage. This paper presents a new ...
d Abstract) Thomas Schwentick and Thomas Zeume TU Dortmund University The finite satisfiability problem for two-variable logic over structures with unary relations and two order re...
— Structural transformation of a design to enhance its testability while satisfying design constraints on power and performance, can result in improved test cost and test confid...
Previous approaches to designing random pattern testable circuits use post-synthesis test point insertion to eliminate random pattern resistant (r.p.r.) faults. The approach taken...
This paper has two purposes. The first is to present a final coalgebra construction for finitary endofunctors on Set that uses a certain subset L∗ of the limit L of the firs...