2299 search results - page 384 / 460 » Logical Data Expiration |
ICPPW
2003
IEEE
15 years 4 months ago
2003
IEEE
Users have been demanding information “anytime, anywhere”. The notion of accessing diverse and autonomous information repositories with different APIs is not accepted. This ha...
ITC
2003
IEEE
15 years 4 months ago
2003
IEEE
ct This paper describes a general technique to test external memory/caches and memory interconnects using on-chip logic. Such a test methodology is expected to significantly reduc...
ITC
2003
IEEE
15 years 4 months ago
2003
IEEE
When developing new designs, debugging the prototype is important to resolve application malfunction. During this board design debug, often a few pins of an IC are measured to che...
STEP
2003
IEEE
15 years 4 months ago
2003
IEEE
The adoption of the Internet technologies favors the diffusion of Web and Grid-based applications. However, the development of new applications exploiting the modern interfaces an...
ISPD
2003
ACM
15 years 4 months ago
2003
ACM
For multi-gigahertz designs in nanometer technologies, data transfers on global interconnects take multiple clock cycles. In this paper, we propose a regular distributed register ...