2299 search results - page 386 / 460 » Logical Data Expiration |
180
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DATE
2010
IEEE
15 years 11 months ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
158
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FCCM
2002
IEEE
15 years 10 months ago
2002
IEEE
This paper presents three reconfigurable computing approaches for a Shape-Adaptive Template Matching (SA-TM) method to retrieve arbitrarily shaped objects within images or video f...
159
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ICEIS
2002
IEEE
15 years 10 months ago
2002
IEEE
: In this paper we present our most recent work carried out in the wider context of the IST-ADRENALIN project, to facilitate formation and lifecycle management of networked enterpr...
166
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ICPADS
2002
IEEE
15 years 10 months ago
2002
IEEE
This paper presents the study and results of running several core multimedia applications on a simultaneous multithreading (SMT) architecture, including some detailed analysis ran...
181
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MSE
2002
IEEE
15 years 10 months ago
2002
IEEE
This paper presents the study of running several core multimedia applications on a simultaneous multithreading (SMT) architecture and derives design principles for multimedia soft...