2299 search results - page 441 / 460 » Logical Data Expiration |
178
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PPDP
2007
Springer
15 years 12 months ago
2007
Springer
We give a novel transformation for proving termination of higher-order rewrite systems in the format of Inductive Data Type Systems (IDTSs) by Blanqui, Jouannaud and Okada. The tr...
155
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SEMWEB
2007
Springer
15 years 12 months ago
2007
Springer
This paper summarizes the results of the X-SOM tool in the OAEI 2007 campaign. X-SOM is an extensible ontology mapper that combines various matching algorithms by means of a feed-f...
147
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DFT
2006
IEEE
15 years 11 months ago
2006
IEEE
1 High temperature has become a major problem for system-on-chip testing. In order to reduce the test time while keeping the temperature of the chip under test within a safe range,...
140
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MICRO
2006
IEEE
15 years 11 months ago
2006
IEEE
To protect processor logic from soft errors, multicore redundant architectures execute two copies of a program on separate cores of a chip multiprocessor (CMP). Maintaining identi...
142
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RTSS
2006
IEEE
15 years 11 months ago
2006
IEEE
A real-time database is composed of real-time objects whose values remain valid only within their validity intervals. Each object in the database models a real world entity. The f...