19 search results - page 2 / 4 » March Tests for Word-Oriented Memories |
ATS
2003
IEEE
13 years 11 months ago
2003
IEEE
The analysis of linked faults has proven to be a source for new memory tests, characterized by an increased fault coverage. The paper gives a set of five new tests to target all ...
ICCAD
2000
IEEE
13 years 10 months ago
2000
IEEE
We present an error catch and analysis (ECA) system for semiconductor memories. The system consists of a test algorithm generator called TAGS, a fault simulator called RAMSES, and...
DDECS
2007
IEEE
14 years 18 days ago
2007
IEEE
: In this paper we study Complex Read Faults in SRAMs, a combination of various malfunctions that affect the read operation in nanoscale memories. All the memory elements involved ...
ETS
2006
IEEE
13 years 6 months ago
2006
IEEE
VTS
2005
IEEE
13 years 11 months ago
2005
IEEE
Testing data retention faults (DRFs), particularly in integrated systems on chip comprised of very large number of various sizes and types of embedded SRAMs is challenging and typ...