2061 search results - page 11 / 413 » Measuring Corner Properties |
18
Voted
JCISD
1998
15 years 3 days ago
1998
108
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CSFW
2012
IEEE
13 years 2 months ago
2012
IEEE
Abstract—This paper introduces g-leakage, a rich generalization of the min-entropy model of quantitative information flow. In g-leakage, the benefit that an adversary derives f...
86
Voted
ASPDAC
2007
ACM
15 years 4 months ago
2007
ACM
- For sub-90nm technology nodes and below, random fluctuations of within-die physical process properties are also known as random on-chip variation (OCV). It impacts on the VLSI/So...
133
Voted
VISUAL
2000
Springer
15 years 4 months ago
2000
Springer
In image retrieval, global features related to color or texture are commonly used to describe the image. The use of interest points in contentbased image retrieval allows image ind...
101
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PRL
2006
15 years 11 days ago
2006
Corners and junctions are landmarks characterized by the lack of differentiability in the unit tangent to the image level curve. Detectors based on differential operators are not,...