1813 search results - page 107 / 363 » Measuring the Effectiveness of Software Testing |
137
Voted
ICSE
2008
IEEE-ACM
16 years 3 months ago
2008
IEEE-ACM
To reduce the manual effort of assessing potential affected program parts during software evolution, we develop a tool, called Celadon, which automates the change impact analysis ...
116
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VTS
2006
IEEE
15 years 9 months ago
2006
IEEE
A statistical technique X-IDDQ for extracting defect information from IDDQ data is presented that is effective for detection of defects in ICs. The technique treats the IDDQ measu...
ITC
2003
IEEE
15 years 8 months ago
2003
IEEE
Very Deep Sub-Micron (VDSM) defects are resolved as Statistical Post-Processing™ (SPP) outliers of a new IDDQ screen. The screen applies an IDDQ pattern once to the Device Under...
137
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PLDI
2009
ACM
15 years 10 months ago
2009
ACM
Data races are one of the most common and subtle causes of pernicious concurrency bugs. Static techniques for preventing data races are overly conservative and do not scale well t...
126
Voted
ICPR
2004
IEEE
16 years 4 months ago
2004
IEEE
This paper details the results of a Face Authentication Test (FAT2004) [2] held in conjunction with the 17th International Conference on Pattern Recognition. The contest was held ...