8600 search results - page 362 / 1720 » Measuring with Timed Patterns |
131
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ICML
1999
IEEE
16 years 4 months ago
1999
IEEE
Most machine learning algorithms share the following drawback: they only output bare predictions but not the con dence in those predictions. In the 1960s algorithmic information t...
ITC
2003
IEEE
15 years 9 months ago
2003
IEEE
Very Deep Sub-Micron (VDSM) defects are resolved as Statistical Post-Processing™ (SPP) outliers of a new IDDQ screen. The screen applies an IDDQ pattern once to the Device Under...
137
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DMDW
2000
15 years 5 months ago
2000
View materialization is a central issue in logical design of data warehouses since it is one of the most powerful techniques to improve the response to the workload. Most approach...
262
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Book
"The documentation is missing or obsolete, and the original developers have departed. Your team has limited understanding of the system, and unit tests are missing for many, i...
155
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Publication
Round-trips between home and work represent, for the majority of people, most of their daily
commuting time; also, setting home and work places involves more constraints for two- ...