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ICML
2006
IEEE
16 years 3 months ago
Discriminative cluster analysis
Clustering is one of the most widely used statistical tools for data analysis. Among all existing clustering techniques, k-means is a very popular method because of its ease of pr...
Fernando De la Torre, Takeo Kanade
ISBI
2006
IEEE
16 years 3 months ago
Assessing the accuracy of non-rigid registration with and without ground truth
We compare two methods for assessing the performance of groupwise non-rigid registration algorithms. One approach, which has been described previously, utilizes a measure of overl...
Roy Schestowitz, Carole J. Twining, Timothy F. Coo...
KDD
2006
ACM
112views Data Mining» more  KDD 2006»
16 years 3 months ago
K-means clustering versus validation measures: a data distribution perspective
K-means is a widely used partitional clustering method. While there are considerable research efforts to characterize the key features of K-means clustering, further investigation...
Hui Xiong, Junjie Wu, Jian Chen
ICCAD
2008
IEEE
138views Hardware» more  ICCAD 2008»
15 years 11 months ago
Fault tolerant placement and defect reconfiguration for nano-FPGAs
—When manufacturing nano-devices, defects are a certainty and reliability becomes a critical issue. Until now, the most pervasive methods used to address reliability, involve inj...
Amit Agarwal, Jason Cong, Brian Tagiku
ICCAD
2007
IEEE
143views Hardware» more  ICCAD 2007»
15 years 11 months ago
TIP-OPC: a new topological invariant paradigm for pixel based optical proximity correction
—As the 193nm lithography is likely to be used for 45nm and even 32nm processes, much more stringent requirement will be posed on Optical Proximity Correction (OPC) technologies....
Peng Yu, David Z. Pan
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