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DATE
2010
IEEE
161views Hardware» more  DATE 2010»
15 years 9 months ago
BISD: Scan-based Built-In self-diagnosis
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
Melanie Elm, Hans-Joachim Wunderlich
3DPVT
2002
IEEE
169views Visualization» more  3DPVT 2002»
15 years 9 months ago
Compression of Isosurfaces for Structured Volumes with Context Modelling
In many applications surfaces with a large number of primitives occur. Geometry compression reduces storage space and transmission time for such models. A special case is given by...
Dietmar Saupe, Jens-Peer Kuska
ECAI
2000
Springer
15 years 8 months ago
Lazy Propositionalisation for Relational Learning
A number of Inductive Logic Programming (ILP) systems have addressed the problem of learning First Order Logic (FOL) discriminant definitions by first reformulating the FOL lear...
Érick Alphonse, Céline Rouveirol
IPPS
1998
IEEE
15 years 8 months ago
Optimistic Synchronization of Mixed-Mode Simulators
Mixed-Mode simulation has been generating considerable interest in the simulation community and has continued to grow as an active research area. Traditional mixed-mode simulation...
Peter Frey, Radharamanan Radhakrishnan
ASPDAC
2007
ACM
124views Hardware» more  ASPDAC 2007»
15 years 8 months ago
BddCut: Towards Scalable Symbolic Cut Enumeration
While the covering algorithm has been perfected recently by the iterative approaches, such as DAOmap and IMap, its application has been limited to technology mapping. The main fact...
Andrew C. Ling, Jianwen Zhu, Stephen Dean Brown