Testing and diagnosis are important issues in system-onchip (SOC) development, as more and more embedded cores are being integrated into the chips. In this paper we propose a buil...
A central problem in built-in self test (BIST) is how to efficiently generate a small set of test vectors that detect all targeted faults. We propose a novel solution that uses l...
This paper presents a new application field for the Goertzel algorithm. The test of mixed-signal circuits involves the generation and analysis of signals. A standard method for th...
The cost for testing integrated circuits represents a growing percentage of the total cost for their production. The former strictly depends on the length of the test session, and...
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...
Diagnosing failing vectors in a Built-In Self Test (BIST) environment is a difficult task because of the highly compressed signature coming out of the Multiple Input Shift Regist...