232 search results - page 23 / 47 » MicroNetwork-Based Integration for SOCs |
DAC
2007
ACM
16 years 23 days ago
2007
ACM
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
DFT
2006
IEEE
15 years 5 months ago
2006
IEEE
1 High temperature has become a major problem for system-on-chip testing. In order to reduce the test time while keeping the temperature of the chip under test within a safe range,...
110
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SAMOS
2004
Springer
15 years 5 months ago
2004
Springer
In recent years, power consumption has become a critical concern for many VLSI systems. Whereas several case studies demonstrate that technology-, layout-, and gate-level technique...
95
Voted
ASPDAC
2007
ACM
15 years 3 months ago
2007
ACM
As the large size of test data volume is becoming one of the major problems in testing System-on-a-Chip (SoC), several compression coding schemes have been proposed. Extended frequ...
112
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DATE
2004
IEEE
15 years 3 months ago
2004
IEEE
Energy efficient embedded systems consist of a heterogeneous collection of very specific building blocks, connected together by a complex network of many dedicated busses and inte...