5506 search results - page 346 / 1102 » Minimal Logic Programs |
112
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ITC
2000
IEEE
15 years 9 months ago
2000
IEEE
We present the application of a deterministic logic BIST scheme on state-of-the-art industrial circuits. Experimental results show that complete fault coverage can be achieved for...
150
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DAC
1996
ACM
15 years 9 months ago
1996
ACM
We propose a low-overhead scan design methodology which employs a new test point insertion technique to establish scan paths through the functional logic. The technique re-uses th...
157
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DSN
2008
IEEE
15 years 6 months ago
2008
IEEE
The combination of continued technology scaling and increased on-chip transistor densities has made vulnerability to radiation induced soft errors a significant design concern. In...
121
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ESSCIRC
2011
14 years 4 months ago
2011
— Within-functional-block fine-grained adaptive dual supply voltage control (FADVC) is proposed to reduce the power of CMOS logic circuits. Both process and design variations wi...
115
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KBSE
2003
IEEE
15 years 10 months ago
2003
IEEE
Automating software evolution requires both identifying precisely the affected program points and selecting the appropriate modification at each point. This task is particularly ...