71 search results - page 5 / 15 » Mining IC test data to optimize VLSI testing |
KDD
2009
ACM
15 years 10 months ago
2009
ACM
We present an algorithm, called the offset tree, for learning in situations where a loss associated with different decisions is not known, but was randomly probed. The algorithm i...
KDD
2006
ACM
15 years 10 months ago
2006
ACM
KDD is a complex and demanding task. While a large number of methods has been established for numerous problems, many challenges remain to be solved. New tasks emerge requiring th...
PAKDD
2010
ACM
15 years 2 months ago
2010
ACM
Abstract. Mining of data streams must balance three evaluation dimensions: accuracy, time and memory. Excellent accuracy on data streams has been obtained with Naive Bayes Hoeffdi...
103
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ICCAD
1999
IEEE
15 years 1 months ago
1999
IEEE
We consider the problem of finding an optimal clock schedule, i.e. optimal arrival times for clock signals at latches of a VLSI chip. We describe a general model which includes al...
100
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KDD
2008
ACM
15 years 10 months ago
2008
ACM
The effectiveness of knowledge transfer using classification algorithms depends on the difference between the distribution that generates the training examples and the one from wh...