1992 search results - page 141 / 399 » Model Based Testing with Labelled Transition Systems |
110
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DATE
2006
IEEE
15 years 9 months ago
2006
IEEE
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
131
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ISSRE
2010
IEEE
15 years 1 months ago
2010
IEEE
—Web 2.0 applications are increasing in popularity. However, they are also prone to errors because of their dynamic nature. This paper presents DoDOM, an automated system for tes...
116
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INTERSPEECH
2010
14 years 10 months ago
2010
Update of acoustic and language models is vital to maintain performance of automatic speech recognition (ASR) systems. To alleviate efforts for updating models, we propose a "...
180
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TSE
2011
14 years 10 months ago
2011
— We propose a new probabilistic temporal logic iLTL which captures properties of systems whose state can be represented by probability mass functions (pmf’s). Using iLTL, we c...
160
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EMNLP
2007
15 years 4 months ago
2007
We describe a two-stage optimization of the MaltParser system for the ten languages in the multilingual track of the CoNLL 2007 shared task on dependency parsing. The first stage...