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TCAD
2010
98views more  TCAD 2010»
14 years 11 months ago
Statistical Modeling With the PSP MOSFET Model
PSP and the backward propagation of variance (BPV) method are used to characterize the statistical variations of metal-oxide-semiconductor field effect transistors (MOSFETs). BPV s...
Xin Li, Colin C. McAndrew, Weimin Wu, Samir Chaudh...
ISPW
2009
IEEE
15 years 11 months ago
Software Product Quality: Ensuring a Common Goal
: Software qualities are in many cases tacit and hard to measure. Thus, there is a potential risk that they get lower priority than deadlines, cost and functionality. This paper pr...
Sebastian Barney, Claes Wohlin
ICSM
2005
IEEE
15 years 10 months ago
Quality Driven Software Migration of Procedural Code to Object-Oriented Design
In the context of software maintenance, legacy software systems are continuously re-engineered in order to correct errors, provide new functionality, or port them into modern plat...
Ying Zou
OOPSLA
2007
Springer
15 years 11 months ago
DigitalAssets discoverer: automatic identification of reusable software components
DigitalAssets Discoverer is a tool that implements a group of indicators for automatic identification of software components that can be reused in the development of new applicati...
Eduardo Machado Gonçalves, Marcilio Silva O...
VAMOS
2010
Springer
15 years 6 months ago
Automating the Configuration of Multi Software Product Lines
The increased use of software product lines (SPLs) results in complex software systems in which products of multiple SPLs communicate and interact with each other. Such a system of...
Marko Rosenmüller, Norbert Siegmund