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JETC
2008
50views more  JETC 2008»
15 years 10 days ago
Parametric yield management for 3D ICs: Models and strategies for improvement
Cesare Ferri, Sherief Reda, R. Iris Bahar
JCSS
2006
40views more  JCSS 2006»
15 years 9 days ago
A parametric analysis of the state-explosion problem in model checking
Stéphane Demri, François Laroussinie...
MJ
2008
80views more  MJ 2008»
15 years 9 days ago
Dielectric function analysis of ZnSe and CdSe using parametric semiconductor model
We present the dielectric function spectra of ZnSe and CdSe at room temperature between 0.7 and 9 eV obtained by vacuum ultraviolet ellipsometry measurement. We have observed the ...
Y. W. Jung, J. J. Yoon, J. S. Byun, Y. D. Kim