We are developing a module-oriented, multiphysics, mixed-fidelity system simulation environment that will enable engineers to rapidly analyze the performance of a system and to o...
David R. Gardner, Joseph P. Castro, Paul N. Demmie...
Within-die process variations arise during integrated circuit (IC) fabrication in the sub-100nm regime. These variations are of paramount concern as they deviate the performance of...
Many interactive image segmentation approaches use an objective function which includes appearance models as an unknown variable. Since the resulting optimization problem is NP-har...
Parametric models of shape and texture such as Active Appearance Models (AAMs) are diverse tools for deformable object appearance modeling and have found important applications in...
We present an improved statistical model of Poisson processes, with applications in photon-limited imaging. We build on previous work, adopting a multiscale representation of the ...
Stamatios Lefkimmiatis, George Papandreou, Petros ...