853 search results - page 14 / 171 » New test approach for embedded applications |
SDM
2009
SIAM
15 years 6 months ago
2009
SIAM
Most datasets in real applications come in from multiple sources. As a result, we often have attributes information about data objects and various pairwise relations (similarity) ...
SAC
2002
ACM
14 years 9 months ago
2002
ACM
The cost for testing integrated circuits represents a growing percentage of the total cost for their production. The former strictly depends on the length of the test session, and...
IOLTS
2002
IEEE
15 years 2 months ago
2002
IEEE
This paper proposes a new solution for the diagnosis of faults into embedded RAMs, currently under evaluation within STMicroelectronics. The proposed scheme uses dedicated circuit...
KBSE
2006
IEEE
15 years 3 months ago
2006
IEEE
The testing of database applications poses new challenges for software engineers. In particular, it is difficult to thoroughly test the interactions between an application and it...
EMSOFT
2001
Springer
15 years 1 months ago
2001
Springer
The ability to incorporate low-power, wireless communication into embedded devices gives rise to a new genre of embedded software that is distributed, dynamic, and adaptive. This p...