853 search results - page 30 / 171 » New test approach for embedded applications |
106
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VLSID
1999
IEEE
15 years 5 months ago
1999
IEEE
To minimize the time to market and cost of new sub 0.25um process technologies and products, PDF Solutions, Inc., has developed a new comprehensive approach based on the use of pr...
129
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CGO
2004
IEEE
15 years 5 months ago
2004
IEEE
To meet the high demand for powerful embedded processors, VLIW architectures are increasingly complex (e.g., multiple clusters), and moreover, they now run increasingly sophistica...
114
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CVPR
2005
IEEE
16 years 3 months ago
2005
IEEE
We present a new approach, called local discriminant embedding (LDE), to manifold learning and pattern classification. In our framework, the neighbor and class relations of data a...
126
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DATE
1999
IEEE
15 years 5 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
140
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PRL
2002
15 years 1 months ago
2002
The "fly algorithm" is a fast artificial evolution-based technique devised for the exploration of parameter space in pattern recognition applications. In the application...