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DATE
2010
IEEE
15 years 6 months ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
DSD
2006
IEEE
15 years 7 months ago
2006
IEEE
Recently, a number of works have been published on implementing assignment decision diagram models combined with SAT methods to address register-transfer level test pattern genera...
133
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WCRE
2003
IEEE
15 years 6 months ago
2003
IEEE
Graphical user interfaces (GUIs) are important parts of today’s software and their correct execution is required to ensure the correctness of the overall software. A popular tec...
JGAA
2006
15 years 1 months ago
2006
In this paper we present a new characterization of switch-regular upward embeddings, a concept introduced by Di Battista and Liotta in 1998. This characterization allows us to def...
131
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MVA
2007
15 years 2 months ago
2007
In this paper we present an evaluation method for stereo matching systems and sensors especially for real world indoor applications. We estimate ground truth reference images by i...