853 search results - page 76 / 171 » New test approach for embedded applications |
102
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GCSE
2000
Springer
15 years 5 months ago
2000
Springer
Software reuse and especially the paradigm of software components are promising approaches to increase the efficiency of software development. One of the basic problems of software...
123
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ACISP
2006
Springer
15 years 7 months ago
2006
Springer
Abstract. The emergence of computing environments where smart devices are embedded pervasively in the physical world has made possible many interesting applications and has trigger...
115
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IPPS
2007
IEEE
15 years 7 months ago
2007
IEEE
With the increasing gap between processor speed and memory latency, the performance of data-dominated programs are becoming more reliant on fast data access, which can be improved...
136
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ISCAS
2007
IEEE
15 years 7 months ago
2007
IEEE
Due to the development of high speed circuits beyond the 2-GHz mark, the significance of automatic test pattern generation for Path Delay Faults (PDFs) drastically increased in t...
115
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TNN
2011
14 years 8 months ago
2011
—In some applications, the probability of error of a given classifier is too high for its practical application, but we are allowed to gather more independent test samples from ...