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VTS
2007
IEEE
143views Hardware» more  VTS 2007»
15 years 3 months ago
RTL Test Point Insertion to Reduce Delay Test Volume
In this paper, a novel test point insertion methodology is presented for RTL designs that aims to reduce the data volume of scan-based transition delay tests. Test points are iden...
Kedarnath J. Balakrishnan, Lei Fang
VTS
2000
IEEE
167views Hardware» more  VTS 2000»
15 years 1 months ago
Path Selection for Delay Testing of Deep Sub-Micron Devices Using Statistical Performance Sensitivity Analysis
The performance of deep sub-micron designs can be affected by various parametric variations, manufacturing defects, noise or even modeling errors that are all statistical in natur...
Jing-Jia Liou, Kwang-Ting Cheng, Deb Aditya Mukher...
DATE
2006
IEEE
108views Hardware» more  DATE 2006»
15 years 3 months ago
Software-friendly HW/SW co-simulation: an industrial case study
This paper proposes a novel HW/SW co-simulation approach that minimizes the impact on software designers. We propose a SystemC-based system that enables the software team to test ...
Juanjo Noguera, Luis Baldez, Narcis Simon, Lluis A...
ISPD
2003
ACM
132views Hardware» more  ISPD 2003»
15 years 2 months ago
Architecture and synthesis for multi-cycle communication
For multi-gigahertz designs in nanometer technologies, data transfers on global interconnects take multiple clock cycles. In this paper, we propose a regular distributed register ...
Jason Cong, Yiping Fan, Xun Yang, Zhiru Zhang
IPPS
2007
IEEE
15 years 3 months ago
Enhancing Portability of HPC Applications across High-end Computing Platforms
Fast hardware turnover in supercomputing centers, stimulated by rapid technological progress, results in high heterogeneity among HPC platforms, and necessitates that applications...
Magdalena Slawiñska, Jaroslaw Slawinski, Da...