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» Novel Test Pattern Generators for Pseudo-Exhaustive Testing
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97
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ICTAI
1994
IEEE
15 years 5 months ago
GATTO: An Intelligent Tool for Automatic Test Pattern Generation for Digital Circuits
Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza ...
ITC
1994
IEEE
136views Hardware» more  ITC 1994»
15 years 5 months ago
An Automatic Test Pattern Generator for Large Sequential Circuits Based on Genetic Algorithms
Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza ...
96
Voted
ATS
2000
IEEE
86views Hardware» more  ATS 2000»
15 years 6 months ago
An adjacency-based test pattern generator for low power BIST design
Patrick Girard, Loïs Guiller, Christian Landr...
90
Voted
ATS
1998
IEEE
106views Hardware» more  ATS 1998»
15 years 6 months ago
A Test Pattern Generation Algorithm Exploiting Behavioral Information
This paper aims at broadening the scope of hierarchical ATPG to the behavioral-level The main problem of using behavioral information for ATPG is the mismatch of timing models bet...
Silvia Chiusano, Fulvio Corno, Paolo Prinetto
SAC
1997
ACM
15 years 5 months ago
SAARA: a simulated annealing algorithm for test pattern generation for digital circuits
Fulvio Corno, Paolo Prinetto, Maurizio Rebaudengo,...