1721 search results - page 51 / 345 » On Active and Passive Testing |
GPEM
2006
14 years 9 months ago
2006
Abstract. Bedau et al.'s statistical classification system for long-term evolutionary dynamics provides a test for open-ended evolution. Making this test more rigorous, and pa...
CEC
2005
IEEE
15 years 3 months ago
2005
IEEE
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...
ET
2000
14 years 9 months ago
2000
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...
INFOCOM
2007
IEEE
15 years 4 months ago
2007
IEEE
Abstract— This research focuses on RFID-based 3-D positioning schemes, aiming to locate an object in a 3-dimensional space, with reference to a predetermined arbitrary coordinate...
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ISORC
2002
IEEE
15 years 2 months ago
2002
IEEE
This paper presents measured probability density functions (pdfs) for the end-to-end latency of two-way remote method invocations from a CORBA client to a replicated CORBA server ...