123 search results - page 12 / 25 » On Statistical Timing Analysis with Inter- and Intra-Die Var... |
ITC
1999
IEEE
15 years 2 months ago
1999
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. The power supply transient signals of an ...
ASPDAC
2007
ACM
15 years 1 months ago
2007
ACM
- Advanced process technologies impose more significant challenges especially when manufactured circuits exhibit substantial process variations. Consideration of process variations...
ETT
2000
14 years 9 months ago
2000
We analyze the effects of Doppler spread in mobile channels on Orthogonal Frequency Division Multiplex (OFDM) systems. This is important, since channel variations during one OFDM s...
FPGA
2007
ACM
15 years 3 months ago
2007
ACM
Variations in the semiconductor fabrication process results in variability in parameters between transistors on the same die, a problem exacerbated by lithographic scaling. The re...
VTS
2000
IEEE
15 years 2 months ago
2000
IEEE
The performance of deep sub-micron designs can be affected by various parametric variations, manufacturing defects, noise or even modeling errors that are all statistical in natur...