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» On Testing Answer-Set Programs
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APLAS
2006
ACM
15 years 8 months ago
Automatic Testing of Higher Order Functions
This paper tackles a problem often overlooked in functional programming community: that of testing. Fully automatic test tools like Quickcheck and G∀ST can test first order func...
Pieter W. M. Koopman, Rinus Plasmeijer
154
Voted
SBCCI
2005
ACM
185views VLSI» more  SBCCI 2005»
15 years 7 months ago
Automatic generation of test sets for SBST of microprocessor IP cores
Higher integration densities, smaller feature lengths, and other technology advances, as well as architectural evolution, have made microprocessor cores exceptionally complex. Cur...
Ernesto Sánchez, Matteo Sonza Reorda, Giova...
COMPSAC
2007
IEEE
15 years 6 months ago
AOP-based automated unit test classification of large benchmarks
Despite the availability of a variety of program analysis tools, evaluation of these tools is difficult, as only few benchmark suites exist. Existing benchmark suites lack the uni...
Cyrille Artho, Zhongwei Chen, Shinichi Honiden
ITC
1991
IEEE
80views Hardware» more  ITC 1991»
15 years 5 months ago
An Intelligent Approach to Automatic Test Equipment
In diagnosing a failed system, a smart technician would choose tests to be performed based on the context of the situation. Currently, test program sets do not fault-. isolate wit...
William R. Simpson, John W. Sheppard
ET
2002
72views more  ET 2002»
15 years 2 months ago
Deterministic Test Vector Compression/Decompression for Systems-on-a-Chip Using an Embedded Processor
Abstract. A novel approach for using an embedded processor to aid in deterministic testing of the other components of a system-on-a-chip (SOC) is presented. The tester loads a prog...
Abhijit Jas, Nur A. Touba