2995 search results - page 358 / 599 » On multi-avoidance of generalized patterns |
98
Voted
DAC
2008
ACM
16 years 1 months ago
2008
ACM
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
89
Voted
DAC
2007
ACM
16 years 1 months ago
2007
ACM
Many STUMPS architectures found in current chip designs allow disabling of individual scan chains for debug and diagnosis. In a recent paper it has been shown that this feature can...
101
Voted
DAC
2003
ACM
16 years 1 months ago
2003
ACM
Reseeding is used to improve fault coverage of pseudorandom testing. The seed corresponds to the initial state of the PRPG before filling the scan chain. In this paper, we present...
DAC
2003
ACM
16 years 1 months ago
2003
ACM
Cyclic circuits that do not hold state or oscillate are often the most convenient representation for certain functions, such as arbiters, and can easily be produced inadvertently ...
103
click to vote
DAC
2004
ACM
16 years 1 months ago
2004
ACM
As process technology migrates to deep submicron with feature size less than 100nm, global wire delay is becoming a major hindrance in keeping the latency of intra-chip communicat...