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» On the Circuit Implementation Problem
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VLSID
2002
IEEE
115views VLSI» more  VLSID 2002»
16 years 4 months ago
A Partitioning and Storage Based Built-In Test Pattern Generation Method for Scan Circuits
We describe a built-in test pattern generation method for scan circuits. The method is based on partitioning and storage of test sets. Under this method, a precomputed test set is...
Irith Pomeranz, Sudhakar M. Reddy
115
Voted
FDL
2006
IEEE
15 years 9 months ago
Randomized Simulation of Hybrid Systems For Circuit Validation
Abstract. The paper proposes a simulation-based method for validating analog and mixed-signal circuits, using the hybrid systems methodology. This method builds upon RRT (Rapidly-e...
Thao Dang, Tarik Nahhal
IOLTS
2006
IEEE
84views Hardware» more  IOLTS 2006»
15 years 9 months ago
Fault Tolerant System Design Method Based on Self-Checking Circuits
This paper describes a highly reliable digital circuit design method based on totally self checking blocks implemented in FPGAs. The bases of the self checking blocks are parity p...
Pavel Kubalík, Petr Fiser, Hana Kubatova
137
Voted
GLVLSI
2005
IEEE
103views VLSI» more  GLVLSI 2005»
15 years 9 months ago
Causal probabilistic input dependency learning for switching model in VLSI circuits
Switching model captures the data-driven uncertainty in logic circuits in a comprehensive probabilistic framework. Switching is a critical factor that influences dynamic, active ...
Nirmal Ramalingam, Sanjukta Bhanja
144
Voted
ISMVL
1999
IEEE
133views Hardware» more  ISMVL 1999»
15 years 8 months ago
Ternary Multiplication Circuits Using 4-Input Adder Cells and Carry Look-Ahead
We introduce a new implementation of a ternary adder with four inputs and two outputs. This ternary adder reduces the number of digits in a multiplication compared with a binary m...
Andreas Herrfeld, Siegbert Hentschke