We describe a built-in test pattern generation method for scan circuits. The method is based on partitioning and storage of test sets. Under this method, a precomputed test set is...
Abstract. The paper proposes a simulation-based method for validating analog and mixed-signal circuits, using the hybrid systems methodology. This method builds upon RRT (Rapidly-e...
This paper describes a highly reliable digital circuit design method based on totally self checking blocks implemented in FPGAs. The bases of the self checking blocks are parity p...
Switching model captures the data-driven uncertainty in logic circuits in a comprehensive probabilistic framework. Switching is a critical factor that influences dynamic, active ...
We introduce a new implementation of a ternary adder with four inputs and two outputs. This ternary adder reduces the number of digits in a multiplication compared with a binary m...