10718 search results - page 199 / 2144 » On the Circuit Implementation Problem |
135
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ISCAS
1999
IEEE
15 years 8 months ago
1999
IEEE
An analog VLSI circuit used to model spectral shape analysis in the central auditory system is presented. Like the receptive fields of visual cortical neurons, the spectral respon...
105
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ICCAD
1997
IEEE
15 years 8 months ago
1997
IEEE
— This paper describes an algorithm for generating provably passive reduced-order N-port models for RLC interconnect circuits. It is demonstrated that, in addition to macromodel ...
135
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VTS
1997
IEEE
15 years 8 months ago
1997
IEEE
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
134
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DAC
1996
ACM
15 years 8 months ago
1996
ACM
In this paper we present an integrated simulation paradigm in which parallel mixed-mode co-simulation is accomplished by integrating sequential simulators in a software simulation ...
134
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DAC
1994
ACM
15 years 8 months ago
1994
ACM
Recent results indicate that functional test pattern generation (TPG) techniques may provide better defect coverages than do traditional logic-level techniques. Functional TPG alg...