10718 search results - page 97 / 2144 » On the Circuit Implementation Problem |
129
Voted
TAP
2010
Springer
15 years 8 months ago
2010
Springer
Abstract. We consider the problem of test generation for Boolean combinational circuits. We use a novel approach based on the idea of treating tests as a proof encoding rather than...
123
Voted
ICCAD
1997
IEEE
15 years 7 months ago
1997
IEEE
Maximum instantaneous power in VLSI circuits has a great impact on circuit's reliability and the design of power and ground lines. To synthesizehighlyreliablesystems,accurate...
128
Voted
ICCAD
1995
IEEE
15 years 7 months ago
1995
IEEE
This paper investigates the effect of the controller on the testability of sequential circuits composed of controllers and data paths. It is shown that even when both the controll...
116
Voted
AICCSA
2006
IEEE
15 years 5 months ago
2006
IEEE
To excite a stuck-open fault in a CMOS combinational circuit, it is only necessary that the output of the gate containing the fault takes on opposite values during the application...
121
Voted
DFT
2006
IEEE
15 years 7 months ago
2006
IEEE
The concept of clocking for QCA, referred to as the four-phase clocking, is widely used. However, inherited characteristics of QCA, such as the way to hold state, the way to synch...