Many power users that contribute to open source projects have no intention of becoming regular contributors; they just want a bug fixed or a feature implemented. How often do thes...
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...
Artem Sokolov, Alodeep Sanyal, L. Darrell Whitley,...
A novel design approach for simultaneous power and stability (static noise margin, SNM) optimization of nanoCMOS static random access memory (SRAM) is presented. A 45nm single-end...
Garima Thakral, Saraju P. Mohanty, Dhruva Ghai, Dh...
We report in this paper the design, fabrication and experimental characterization of a piezoelectric MEMS microgenerator. This device scavenges the energy of ambient mechanical vi...
In this paper, we consider dynamic resource allocation for object-based wireless video communications. In object-based video coding, a video frame is comprised of objects that are...
Haohong Wang, Yiftach Eisenberg, Fan Zhai, Aggelos...