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» On the Simulation of Tikhonov Random Processes
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2009
IEEE
125views Hardware» more  DATE 2009»
15 years 4 months ago
On linewidth-based yield analysis for nanometer lithography
— Lithographic variability and its impact on printability is a major concern in today’s semiconductor manufacturing process. To address sub-wavelength printability, a number of...
Aswin Sreedhar, Sandip Kundu
WSC
2001
14 years 11 months ago
On the MSE robustness of batching estimators
Variance is a classical measure of a point estimator's sampling error. In steady-state simulation experiments, many estimators of this variance--or its square root, the stand...
Yingchieh Yeh, Bruce W. Schmeiser
WSC
2000
14 years 11 months ago
Mathematical programming models of discrete event system dynamics
Analytical models for the dynamics of some discrete event systems are introduced where the system trajectories are solutions to linear and mixed-integer programs. 1 BACKGROUND The...
Lee Schruben
ICIP
2009
IEEE
14 years 7 months ago
Randomness-in-Structured Ensembles for compressed sensing of images
Leading compressed sensing (CS) methods require m = O (k log(n)) compressive samples to perfectly reconstruct a k-sparse signal x of size n using random projection matrices (e.g., ...
Abdolreza A. Moghadam, Hayder Radha
PIMRC
2008
IEEE
15 years 4 months ago
Dynamic data aggregation and transport in wireless sensor networks
—In wireless sensor networks, in-network aggregation is the process of compressing locally the data gathered by the sensor nodes, so that only the compressed data travel across s...
Mario O. Diaz, Kin K. Leung