— Lithographic variability and its impact on printability is a major concern in today’s semiconductor manufacturing process. To address sub-wavelength printability, a number of...
Variance is a classical measure of a point estimator's sampling error. In steady-state simulation experiments, many estimators of this variance--or its square root, the stand...
Analytical models for the dynamics of some discrete event systems are introduced where the system trajectories are solutions to linear and mixed-integer programs. 1 BACKGROUND The...
Leading compressed sensing (CS) methods require m = O (k log(n)) compressive samples to perfectly reconstruct a k-sparse signal x of size n using random projection matrices (e.g., ...
—In wireless sensor networks, in-network aggregation is the process of compressing locally the data gathered by the sensor nodes, so that only the compressed data travel across s...