We present a new class of problems, called resource-bounded information gathering for correlation clustering. Our goal is to perform correlation clustering under circumstances in w...
The run-time performance of VLIW (very long instruction word) microprocessors depends heavily on the effectiveness of its associated optimizing compiler. Typical VLIW compiler pha...
1 High temperature has become a major problem for system-on-chip testing. In order to reduce the test time while keeping the temperature of the chip under test within a safe range,...
Zhiyuan He, Zebo Peng, Petru Eles, Paul M. Rosinge...
This paper presents a technique for memory optimization for a class of computations that arises in the field of correlated electronic structure methods such as coupled cluster and...
A. Allam, J. Ramanujam, Gerald Baumgartner, P. Sad...
Design for Manufacturability (DFM) is becoming increasingly important as process geometries shrink. Conventional design rule pass/fail is not adequate to quantify DFM compliance. ...