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ICPR
2004
IEEE
16 years 5 months ago
Large Scale Feature Selection Using Modified Random Mutation Hill Climbing
Feature selection is a critical component of many pattern recognition applications. There are two distinct mechanisms for feature selection, namely the wrapper method and the filt...
Anil K. Jain, Michael E. Farmer, Shweta Bapna
ICPR
2002
IEEE
16 years 5 months ago
Spatial Color Component Matching of Images
Color and color neighborhood statistics have been used extensively in image matching and retrieval. However, the effective incorporation of color layout information remains a chal...
Jianying Hu, Efstathios Hadjidemetriou
ICIP
2009
IEEE
16 years 5 months ago
Segmentation On Surfaces With The Closest Point Method
We propose a method to detect objects and patterns in textures on general surfaces. Our approach applies the Chan?Vese variational model for active contours without edges to the p...
DAC
2009
ACM
16 years 5 months ago
On systematic illegal state identification for pseudo-functional testing
The discrepancy between integrated circuits' activities in normal functional mode and that in structural test mode has an increasing adverse impact on the effectiveness of ma...
Feng Yuan, Qiang Xu
DAC
2008
ACM
16 years 5 months ago
Scan chain clustering for test power reduction
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
Christian G. Zoellin, Hans-Joachim Wunderlich, Jen...