204 search results - page 20 / 41 » Parameterizations of Test Cover with Bounded Test Sizes |
CINQ
2004
Springer
15 years 4 months ago
2004
Springer
Mining Frequent Itemsets is the core operation of many data mining algorithms. This operation however, is very data intensive and sometimes produces a prohibitively large output. I...
DAC
2009
ACM
15 years 11 months ago
2009
ACM
Continuously shrinking feature sizes result in an increasing susceptibility of circuits to transient faults, e.g. due to environmental radiation. Approaches to implement fault tol...
VTS
2006
IEEE
15 years 4 months ago
2006
IEEE
A new algorithm for identifying stuck faults in combinational circuits that cannot be detected by a given input sequence is presented. Other than pre and post-processing steps, ce...
ATS
2005
IEEE
15 years 15 days ago
2005
IEEE
Reversibility is of interest in achieving extremely low power dissipation; it is also an inherent design requirement of quantum computation. Logical fault models for conventional ...
COMBINATORICS
2004
14 years 10 months ago
2004
In this paper we bring together the areas of combinatorics and propositional satisfiability. Many combinatorial theorems establish, often constructively, the existence of positive...