IDDQ testing has been used as a test technique to supplement voltage testing of CMOS chips. The idea behind IDDQ testing is to declare a chip as faulty if the steady-state current...
This paper presents an eective multiple clocking scheme for lower power RTL circuit design. The basis is to partition a behavioral description of the circuit into m modules fed b...
Christos A. Papachristou, Mark Spining, Mehrdad No...
In this paper, we present a probabilistic simulation technique to estimate the power consumption of a cmos circuit under a general delay model. This technique is based on the noti...
Abstract -- This paper introduces a new HW/SW partitioning algorithm used in automating the instruction set processor design for pipelined ASIP (Application Specific Integrated Pro...
Asynchronous circuits are crucial in designing low power and high performance digital systems. In this paper, we present an ecient modular partitioning approach for asynchronous c...