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Path-oriented random testing
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WSC
1992
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Modeling And Simulation
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Testing random number generators
15 years 5 months ago
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Pierre L'Ecuyer
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AMC
2010
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Re-seeding invalidates tests of random number generators
15 years 4 months ago
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Hans Ekkehard Plesser, Anders Grønvik Jahns...
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ETS
2006
IEEE
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Hardware
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ETS 2006
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Minimal March Tests for Dynamic Faults in Random Access Memories
15 years 4 months ago
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www.sakhtafzar.com
Gurgen Harutunyan, Valery A. Vardanian, Yervant Zo...
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CORR
2011
Springer
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CORR 2011
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Algorithmic tests and randomness with respect to a class of measures
14 years 11 months ago
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Laurent Bienvenu, Péter Gács, Mathie...
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JISE
2011
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SETBIST: An Soft-Error Tolerant Built-In Self-Test Scheme for Random Access Memories
14 years 11 months ago
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Tsu-Wei Tseng, Jin-Fu Li
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