1241 search results - page 40 / 249 » Path-oriented random testing |
137
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JCIT
2010
14 years 9 months ago
2010
With the development of telecom business, customer churn prediction becomes more and more important. An outstanding issue in customer churn prediction is high dimensional problem....
108
Voted
DAC
1996
ACM
15 years 6 months ago
1996
ACM
The development of new Field-Programmed, MaskProgrammed and Laser-Programmed Gate Array architectures is hampered by the lack of realistic test circuits that exercise both the arc...
111
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ITC
1996
IEEE
15 years 6 months ago
1996
IEEE
This paper presents a low-overhead scheme for built-in self-test of circuits with scan. Complete (100%) fault coverage is obtained without modifying the function logic and without...
132
Voted
ICML
2008
IEEE
16 years 3 months ago
2008
IEEE
In inductive logic programming, subsumption is a widely used coverage test. Unfortunately, testing -subsumption is NP-complete, which represents a crucial efficiency bottleneck fo...
138
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ICPR
2004
IEEE
16 years 3 months ago
2004
IEEE
We propose a hybrid face recognition method that combines holistic and feature analysis-based approaches using a Markov random field (MRF) model. The face images are divided into ...