1241 search results - page 52 / 249 » Path-oriented random testing |
108
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CEC
2005
IEEE
15 years 8 months ago
2005
IEEE
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...
127
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SEFM
2005
IEEE
15 years 8 months ago
2005
IEEE
The development of test cases is an important issue for testing software, communication protocols and other reactive systems. A number of methods are known for the development of ...
64
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ITC
2003
IEEE
15 years 7 months ago
2003
IEEE
Many of the semiconductor technologies are already facing limitations while new-generation data and telecommunication systems are implemented. Although in its infancy, superconduc...
106
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TAP
2008
Springer
15 years 2 months ago
2008
Springer
This article presents the generation and test case execution under the framework Focal. In the programming language Focal, all properties of the program are written within the sour...
119
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ICCD
2003
IEEE
15 years 11 months ago
2003
IEEE
: Most of the recently discussed and commercially introduced test stimulus data compression techniques are based on low care bit densities found in typical scan test vectors. Data ...