7009 search results - page 1218 / 1402 » Patterns in Complex Systems Modeling |
151
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AINA
2006
IEEE
15 years 9 months ago
2006
IEEE
— In today’s service market the provisioning of high quality services has become a critical issue for providers as the business success of their customers is often based on the...
110
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DATE
2006
IEEE
15 years 9 months ago
2006
IEEE
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
101
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DFT
2006
IEEE
15 years 9 months ago
2006
IEEE
Continued increase in complexity of digital image sensors means that defects are more likely to develop in the field, but little concrete information is available on in-field defe...
109
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HICSS
2006
IEEE
15 years 9 months ago
2006
IEEE
Little research has examined the relevance of real options for valuation of information technology (IT) investments for prioritizing a portfolio of projects. When the effect of pr...
118
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ICCAD
2005
IEEE
15 years 8 months ago
2005
IEEE
— Balanced truncation (BT) model order reduction (MOR) is known for its superior accuracy and computable error bounds. Balanced stochastic truncation (BST) is a particular BT pro...