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» Power Droop Testing

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ITC
1998
IEEE

73views Hardware» more ITC 1998»

Maximization of power dissipation under random excitation for burn-in testing

15 years 4 months ago

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This work proposes an approach to generate weighted random patterns which can maximally excite a circuit during its burn-in testing. The approach is based on a probability model a...

Kuo-Chan Huang, Chung-Len Lee, Jwu E. Chen

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127

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ADAEUROPE
2007
Springer

135views Software Engineering» more ADAEUROPE 2007»

Towards the Testing of Power-Aware Software Applications for Wireless Sensor Networks

15 years 5 months ago

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The testing of programs in wireless sensor networks (WSN) is an important means to assure quality but is a challenging process. As pervasive computing has been identiﬁed as a not...

W. K. Chan, Tsong Yueh Chen, S. C. Cheung, T. H. T...

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105

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BMCBI
2006

148views more BMCBI 2006»

Exploiting the full power of temporal gene expression profiling through a new statistical test: Application to the analysis of m

14 years 11 months ago

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Background: The identification of biologically interesting genes in a temporal expression profiling dataset is challenging and complicated by high levels of experimental noise. Mo...

Veronica Vinciotti, Xiaohui Liu, Rolf Turk, Emile ...

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100

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VTS
2008
IEEE

94views Hardware» more VTS 2008»

Scan-Chain Reordering for Minimizing Scan-Shift Power Based on Non-Specified Test Cubes

15 years 6 months ago