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1419
search results - page 18 / 284
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Power Droop Testing
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FSTTCS
1998
Springer
56
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Software Engineering
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FSTTCS 1998
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The Power of Reachability Testing for Timed Automata
15 years 7 months ago
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Luca Aceto, Patricia Bouyer, Augusto Burgueñ...
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99
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ATS
2001
IEEE
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Hardware
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ATS 2001
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Test Scheduling and Scan-Chain Division under Power Constraint
15 years 7 months ago
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Erik Larsson, Zebo Peng
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94
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ITC
2000
IEEE
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Hardware
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ITC 2000
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Power conscious test synthesis and scheduling for BIST RTL data paths
15 years 7 months ago
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dit.upc.es
Nicola Nicolici, Bashir M. Al-Hashimi
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68
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ASPDAC
2008
ACM
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ASPDAC 2008
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On reducing both shift and capture power for scan-based testing
15 years 5 months ago
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Jia Li, Qiang Xu, Yu Hu, Xiaowei Li
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75
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ASPDAC
2008
ACM
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ASPDAC 2008
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Robust test generation for power supply noise induced path delay faults
15 years 5 months ago
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Xiang Fu, Huawei Li, Yu Hu, Xiaowei Li
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