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FSTTCS
1998
Springer
15 years 3 months ago
The Power of Reachability Testing for Timed Automata
Luca Aceto, Patricia Bouyer, Augusto Burgueñ...
ITC
2000
IEEE
62views Hardware» more  ITC 2000»
15 years 3 months ago
Power conscious test synthesis and scheduling for BIST RTL data paths
Nicola Nicolici, Bashir M. Al-Hashimi
ASPDAC
2008
ACM
83views Hardware» more  ASPDAC 2008»
15 years 1 months ago
On reducing both shift and capture power for scan-based testing
Jia Li, Qiang Xu, Yu Hu, Xiaowei Li
ASPDAC
2008
ACM
78views Hardware» more  ASPDAC 2008»
15 years 1 months ago
Robust test generation for power supply noise induced path delay faults
Xiang Fu, Huawei Li, Yu Hu, Xiaowei Li