1419 search results - page 29 / 284 » Power Droop Testing |
DATE
2002
IEEE
15 years 4 months ago
2002
IEEE
There are some types of faults in analogue and mixed signal circuits which are very difficult to detect using either voltage or current based test methods. However, it is possible...
COMPUTING
2007
14 years 11 months ago
2007
The Krawczyk and the Hansen-Sengupta interval operators are closely related to the interval Newton operator. These interval operators can be used as existence tests to prove exist...
ICCAD
2008
IEEE
15 years 8 months ago
2008
IEEE
—Increasing power densities due to process scaling, combined with high switching activity and poor cooling environments during testing, have the potential to result in high integ...
VTS
2006
IEEE
15 years 5 months ago
2006
IEEE
This paper presents the design and experimental results of fully integrated CMOS power sensors for RF built-in self-test (BIST) applications. Using a standard 0.18- m CMOS process...
ATS
2004
IEEE
15 years 3 months ago
2004
IEEE
In this paper, we propose a low-power testing methodology for the scan-based BIST. A smoother is included in the test pattern generator (TPG) to reduce average power consumption d...