173 search results - page 25 / 35 » Power Reducing Techniques for Clocked CMOS PLAs |
MICRO
2008
IEEE
15 years 6 months ago
2008
IEEE
—Negative bias temperature instability (NBTI), which reduces the lifetime of PMOS transistors, is becoming a growing reliability concern for sub-micrometer CMOS technologies. Par...
ISCAS
2007
IEEE
15 years 6 months ago
2007
IEEE
— Low-power consumption has become a highly important concern for synchronous standard-cell design, and consequently mandates the use of low-power design methodologies and techni...
DAC
1996
ACM
15 years 4 months ago
1996
ACM
: We presentdesign-for-low-power techniques based on glitch reduction for register-transfer level circuits. We analyze the generation and propagation of glitches in both the contro...
TVLSI
2008
14 years 11 months ago
2008
-- Aggressive CMOS scaling results in low threshold voltage and thin oxide thickness for transistors manufactured in deep submicron regime. As a result, reducing the subthreshold a...
TC
2010
14 years 6 months ago
2010
Dynamic voltage and frequency scaling (DVFS) is a well known and effective technique for reducing power consumption in modern microprocessors. An important concern though is to est...