3379 search results - page 65 / 676 » Powers of Two |
DATE
2009
IEEE
15 years 5 months ago
2009
IEEE
— Heat removal and power delivery are two major reliability concerns in the 3D stacked IC technology. Liquid cooling based on micro-fluidic channels is proposed as a viable solu...
ICCD
2006
IEEE
15 years 8 months ago
2006
IEEE
—X-filling is preferred for low-capture-power scan test generation, since it reduces IR-drop-induced yield loss without the need of any circuit modification. However, the effecti...
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ICCD
2002
IEEE
15 years 8 months ago
2002
IEEE
Power is considered to be the major limiter to the design of more faster and complex processors in the near future. In order to address this challenge, a combination of process, c...
ASIACRYPT
2009
Springer
15 years 5 months ago
2009
Springer
We look at iterated power generators si = se i−1 mod N for a random seed s0 ∈ ZN that in each iteration output a certain amount of bits. We show that heuristically an output of...
CEC
2005
IEEE
15 years 4 months ago
2005
IEEE
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...