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KDD
2000
ACM
211views Data Mining» more  KDD 2000»
15 years 1 months ago
Mining IC test data to optimize VLSI testing
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Tony Fountain, Thomas G. Dietterich, Bill Sudyka
ESCIENCE
2006
IEEE
15 years 3 months ago
Managing Large-Scale Workflow Execution from Resource Provisioning to Provenance Tracking: The CyberShake Example
This paper discusses the process of building an environment where large-scale, complex, scientific analysis can be scheduled onto a heterogeneous collection of computational and s...
Ewa Deelman, Scott Callaghan, Edward Field, Hunter...
MOC
2002
131views more  MOC 2002»
14 years 9 months ago
Some baby-step giant-step algorithms for the low hamming weight discrete logarithm problem
In this paper, we present several baby-step giant-step algorithms for the low hamming weight discrete logarithm problem. In this version of the discrete log problem, we are require...
Douglas R. Stinson
VOSS
2004
Springer
135views Mathematics» more  VOSS 2004»
15 years 2 months ago
Analysing Randomized Distributed Algorithms
Abstract. Randomization is of paramount importance in practical applications and randomized algorithms are used widely, for example in co-ordinating distributed computer networks, ...
Gethin Norman
EMSOFT
2005
Springer
15 years 3 months ago
High-level real-time programming in Java
Real-time systems have reached a level of complexity beyond the scaling capability of the low-level or restricted languages traditionally used for real-time programming. While Met...
David F. Bacon, Perry Cheng, David Grove, Michael ...