390 search results - page 58 / 78 » Probability Logic and Logical Probability |
105
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ICCAD
2008
IEEE
15 years 11 months ago
2008
IEEE
—When manufacturing nano-devices, defects are a certainty and reliability becomes a critical issue. Until now, the most pervasive methods used to address reliability, involve inj...
ICCAD
2007
IEEE
15 years 11 months ago
2007
IEEE
Late CMOS scaling reduces device reliability, and existing work has studied the permanent SER (soft error rate) for configuration memory in FPGA extensively. In this paper, we sh...
ICCAD
2006
IEEE
15 years 11 months ago
2006
IEEE
Process variations cause different behavior of timingdependent effects across different chips. In this work, we analyze one example of timing-dependent effects, crosscoupling ...
CAV
2007
Springer
15 years 8 months ago
2007
Springer
lued Abstraction for Continuous-Time Markov Chains⋆ Joost-Pieter Katoen1 , Daniel Klink1 , Martin Leucker2 , and Verena Wolf3 RWTH Aachen University1 , TU Munich2 , University of...
191
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ILP
2007
Springer
15 years 8 months ago
2007
Springer
Abstract. Many reinforcement learning domains are highly relational. While traditional temporal-difference methods can be applied to these domains, they are limited in their capaci...